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Home bias in sovereign exposure and the probability of bank default: evidence from EU stress test data

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Authors and Corporations: Meyland, Dominik (Author), Schäfer, Dorothea (Author)
Other Authors: Schäfer, Dorothea 1957- [Author]
Type of Resource: E-Book
Language: English
published:
Berlin DIW Berlin, German Institute for Economic Research 2021
Series: Deutsches Institut für Wirtschaftsforschung: Discussion papers ; 1943
Subjects:
Source: Verbunddaten SWB
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