Determination of relaxation in thin InGaAs-films by Raman spectroscopy

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Authors and Corporations:

Friedemann Schulz, Johann (Author), Henksmeier, Tobias (Author), Feneberg, Martin (Author), Kluth, Elias (Author), Reuter, Dirk (Author), Goldhahn, Rüdiger (Author)

Other Authors:

Henksmeier, Tobias [Author] • Feneberg, Martin 1978- [Author] • Kluth, Elias [Author] • Reuter, Dirk [Author] • Goldhahn, Rüdiger 1960- [Author]

Type of Resource:

E-Book Component Part

Language:

English

published:

2022

Series:

Source:

Verbunddaten SWB
Lizenzfreie Online-Ressourcen

Parent items:
Deutsche Physikalische Gesellschaft: Verhandlungen der Deutschen Physikalischen Gesellschaft