Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction

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Bibliographic Details

Published in:	Scientific reports volume:6; year:2016; Bd. 6 (2016), Article number: 28459
Authors and Corporations:	Carvalho, Daniel (Author), Müller-Caspary, Knut (Author), Schowalter, Marco (Author), Grieb, Tim (Author), Mehrtens, Thorsten (Author), Rosenauer, Andreas (Author), Ben, Teresa (Author), García, Rafael (Author), Redondo-Cubero, Andrés (Author), Lorenz, Katharina (Author), Daudin, Bruno (Author), Morales, Francisco M. (Author)
Other Authors:	Müller-Caspary, Knut [Author] • Schowalter, Marco [Author] • Grieb, Tim [Author] • Mehrtens, Thorsten [Author] • Rosenauer, Andreas [Author] • Ben, Teresa [Author] • García, Rafael [Author] • Redondo-Cubero, Andrés [Author] • Lorenz, Katharina [Author] • Daudin, Bruno [Author] • Morales, Francisco M. [Author]
Type of Resource:	E-Book Component Part
Language:	English
published:	2016
Series:	Scientific reports, Bd. 6 (2016), Article number: 28459
Source:	Verbunddaten SWB Lizenzfreie Online-Ressourcen
ISSN:	2045-2322