Studies on Methodology for Developing Accelerated Testing by Precise Analysis of Failures Utilizing FTA, and its Application to Semiconductor Sensors.

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Bibliographische Detailangaben

Zeitschriftentitel:	Journal of The Japan Institute of Marine Engineering
Personen und Körperschaften:	Tsutsumi, Nobutoyo, Nishida, Osami
In:	Journal of The Japan Institute of Marine Engineering, 37, 2002, 5, S. 405-415
Format:	E-Article
Sprache:	Unbestimmt
veröffentlicht:	The Japan Institute of Marine Engineering